By Goerg H. Michler
There are many books on electron microscopy, notwithstanding, the research of polymers utilizing EM necessitates detailed ideas, precautions and practise equipment, together with ultramicrotomy. This ebook discusses the overall features of some of the recommendations of EM, together with scanning strength microscopy (AFM). the appliance of those concepts to the research of morphology and houses, fairly micromechanical houses, is defined intimately. Examples from all periods of polymers are presented.
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Additional resources for Electron Microscopy of Polymers
Mm mm is loaded into the camera chamber. In order to record an image, one of the cassettes is transferred from the light-tight box into the position below the screen where the electron image falls on it when the screen is tilted out of the electron beam, and an electrically operated shutter is opened for a preset exposure time. After exposure, the ﬁlm sheet is transferred into the same or another storage box, from where it can be retrieved later for processing to a permanent negative image.
The quantity Cs is the coeﬃcient of spherical aberration, which is a characteristic constant with the dimensions of a length that determines the quality of an electron lens. A value of about mm is typical of Cs for an objective lens in a TEM, while in a HRTEM the value is lowered to about mm. For an electron lens arranged behind the objective lens, the aperture of the incident ray is smaller than the aperture of rays incident into the objective by a factor given by the magniﬁcation of the objective lens.
This defect is caused by the lens ﬁeld acting inhomogeneously on the oﬀ-axis rays. The eﬀects of spherical aberration are shown in Fig. . 24 2 Transmission Electron Microscopy: Fundamentals of Methods and Instrumentation Fig. 4. Formation of a disc of confusion due to spherical aberration For reference we deﬁne the true or so-called Gaussian image plane as the image plane for paraxial imaging conditions. In paraxial imaging conditions, the rays are near the electron-optical axis and make only small angles with respect to the electron-optical axis.